"XJTAG offers incredible power, performance and versatility and can test both boundary scan (JTAG) and cluster (non-JTAG) devices including BGA and chip scale packages.
It is easy to use, the test scripts for non-JTAG devices follow the familiar top down design flow, and these test scripts are device-centric, making them re-usable from project to project, which saves ARM an awful lot of time."
Andy Evans, Senior Product Engineer, Platforms, Development Systems, ARM
