"XJTAG represents the biggest single step in test diagnostics that I have seen in years.
It is an extremely versatile and flexible boundary scan solution, which, unlike some JTAG test products, integrates seamlessly with other test equipment.
Not only will it help to reduce our test NRE expenses, but it will enable us to significantly improve our diagnosis times and test coverage on densely packed circuit boards which are increasingly populated with flip chips, ball grid array and chip scale devices."
Tim Murrell, Senior Electronics Engineer, PartnerTech
