JTAG Boundary Scan Test Systems (IEEE 1149.1)

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boundary scan development and test system

Broschüre

(PDF, 1.6MB)

reusable scripts for testing and debugging

XJEase-Datenblatt
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XJAnalyser-Datenblatt
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XJRunner-Datenblatt
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XJLink-Datenblatt
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XJIO-Board-Datenblatt
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What people are saying...
"With tens of thousands of pins on each board, we recognized that it would not be possible to validate these circuits in a commercially realistic timescale without the use of a boundary scan test system.

XJTAG DFT capability is extremely powerful and saves us a great deal of time, as it automatically handles any netlist changes by adapting to the new circuit connections, thereby avoiding the time-consuming process of manually picking through the netlist for errors."

Spencer Saunders, Engineering Manager, Platforms, Development Systems, ARM
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JTAG Boundary Scan Test Systems (IEEE 1149.1)

XJTAG — Deutsch

What people are saying...