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News Articles - 2004

Electronics Weekly - Oct 12 2004

Shortlists for EW Awards

EE Times - January 13 2005

Board test comes for free.

Electronics Weekly - December 24 2004

Graphical JTAG test tool.

EE Times - December 23 2004

Boundary scan add-on eases production testing.

EE Product Center - December 22 2004

JTAG targets production test.

Embedded Star - July 15 2004

XJTAG boundary scan to integrate into DiagnoSYS' PinPoint II tester.

Embedded Star - June 9 2004

XJTAG enhances boundary scan development system.

Cambridge Evening News - March 9 2004

Design deal goes global.

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What people are saying...
"XJTAG offers incredible power, performance and versatility and can test both boundary scan (JTAG) and cluster (non-JTAG) devices including BGA and chip scale packages.

It is easy to use, the test scripts for non-JTAG devices follow the familiar top down design flow, and these test scripts are device-centric, making them re-usable from project to project, which saves ARM an awful lot of time."

Andy Evans, Senior Product Engineer, Platforms, Development Systems, ARM
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